Stanford-Binet Intelligence Scale

The hardcover exhibits noticeable wear, including water stains and some binding exposure. It lacks a dust jacket and contains library markings, indicating it was once part of a library collection. Despite these flaws, the text remains legible, and the book is structurally sound.

The "Stanford-Binet Intelligence Scale" by Lewis M. Terman and Maud A. Merrill is published by Houghton Mifflin Company in Boston, 1960. This 1962 Impression is a crucial work in the field of psychology and educational testing, offering insights into intelligence measurement. The authors, both affiliated with Stanford University, are renowned for their contributions to psychological assessment. This edition provides the Form L-M revision, reflecting updates in the methodology of the intelligence scale. The book is a valuable resource for psychologists and educators, illustrating the evolution of IQ testing. The hardcover is in fair condition, with some wear, water damage, and library markings, but remains a significant piece for collectors interested in the history of intelligence testing.